国際会議
[1] Rodrigo Vivanco, Yasutaka Kamei, Akito Monden, Ken-ichi Matsumoto, and Dean Jin, "Using Search-Based Metric Selection and Oversampling to Predict Fault Prone Modules," In Proc. IEEE Canadian Conference on Electrical and Computer Engineering 2010 (CCECE2010), pages 1-6 May 2010.