C. Tantithamthavorn, S. McIntosh, A. E. Hassan, and K. Matsumoto, "An Empirical Comparison of Model Validation Techniques for Defect Prediction Models," IEEE Transactions on Software Engineering (TSE), 採録済.
ID 1160
分類 論文誌
タグ comparison defect empirical model models prediction techniques validation
表題 (title) An Empirical Comparison of Model Validation Techniques for Defect Prediction Models
表題 (英文) An Empirical Comparison of Model Validation Techniques for Defect Prediction Models
著者名 (author) Chakkrit Tantithamthavorn,Shane McIntosh,Ahmed E. Hassan,Kenichi Matsumoto
英文著者名 (author) Chakkrit Tantithamthavorn,Shane McIntosh,Ahmed E. Hassan,Kenichi Matsumoto
キー (key) Chakkrit Tantithamthavorn,Shane McIntosh,Ahmed E. Hassan,Kenichi Matsumoto
定期刊行物名 (journal) IEEE Transactions on Software Engineering (TSE)
定期刊行物名 (英文) IEEE Transactions on Software Engineering (TSE)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) 0
出版年 (year) (to appear)
Impact Factor (JCR) 2.3
URL http://chakkrit.com/assets/papers/tantithamthavorn2016mvt.pdf
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル 利用できません.
BiBTeXエントリ
@article{id1160,
         title = {An Empirical Comparison of Model Validation Techniques for Defect Prediction Models},
        author = {Chakkrit Tantithamthavorn and Shane McIntosh and Ahmed E. Hassan and Kenichi Matsumoto},
       journal = {IEEE Transactions on Software Engineering (TSE)},
         month = {0},
          year = {(to appear)},
    impactfactor = {2.3},
}