S. Sato, T. Hayama, A. Monden, and K. Matsumoto, "Classifying Defect-Prone Modules Based on Intra-Module Complexity Metrics from a Large Scale System," In The 2nd World Congress for Software Quality (2WCSQ), pp. 607--612 September 2000.
ID 175
分類 国際会議
タグ classifying complexity defect-prone intra-module large metrics modules scale system
表題 (title) Classifying Defect-Prone Modules Based on Intra-Module Complexity Metrics from a Large Scale System
表題 (英文)
著者名 (author) Shin-ichi Sato, Takeshi Hayama, Akito Monden, Ken-ichi Matsumoto
英文著者名 (author)
編者名 (editor)
編者名 (英文)
キー (key) Shin-ichi Sato, Takeshi Hayama, Akito Monden, Ken-ichi Matsumoto
書籍・会議録表題 (booktitle) The 2nd World Congress for Software Quality (2WCSQ)
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 607--612
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) 9
出版年 (year) 2000
採択率 (acceptance)
URL
付加情報 (note) Yokohama, Japan
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル 利用できません.
BiBTeXエントリ
@inproceedings{id175,
         title = {Classifying defect-prone modules based on intra-module complexity metrics from a large scale system},
        author = {Shin-ichi Sato and  Takeshi Hayama and  Akito Monden and  Ken-ichi Matsumoto},
     booktitle = {The 2nd World Congress for Software Quality (2WCSQ)},
         pages = {607--612},
         month = {9},
          year = {2000},
          note = {Yokohama, Japan},
}