J. Hu, M. Nakanishi, H. Tagaito, K. Shima, K. Matsumoto, K. Inoue, and K. Torii, "A Method of Usability Testing by Measuring Brain Waves," In International Symposium on Future Software Technology 2000 (ISFST2000), pp. 159--164 August 2000.
ID 178
分類 国際会議
タグ brain measuring method testing usability waves
表題 (title) A Method of Usability Testing by Measuring Brain Waves
表題 (英文)
著者名 (author) Jian Hu, Masahiro Nakanishi, Hirokazu Tagaito, Kazuyuki Shima, Ken-ichi Matsumoto, Katsuro Inoue, Koji Torii
英文著者名 (author)
編者名 (editor)
編者名 (英文)
キー (key) Jian Hu, Masahiro Nakanishi, Hirokazu Tagaito, Kazuyuki Shima, Ken-ichi Matsumoto, Katsuro Inoue, Koji Torii
書籍・会議録表題 (booktitle) International Symposium on Future Software Technology 2000 (ISFST2000)
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 159--164
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) 8
出版年 (year) 2000
採択率 (acceptance)
URL
付加情報 (note) Guiyang, China
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル 利用できません.
BiBTeXエントリ
@inproceedings{id178,
         title = {A method of usability testing by measuring brain waves},
        author = {Jian Hu and  Masahiro Nakanishi and  Hirokazu Tagaito and  Kazuyuki Shima and  Ken-ichi Matsumoto and  Katsuro Inoue and  Koji Torii},
     booktitle = {International Symposium on Future Software Technology 2000 (ISFST2000)},
         pages = {159--164},
         month = {8},
          year = {2000},
          note = {Guiyang, China},
}