Y. Kamei, A. Monden, S. Matsumoto, T. Kakimoto, and K. Matsumoto, "The Effects of Over and Under Sampling on Fault-Prone Module Detection," In Proceedings of the 1st International Symposium on Empirical Software Engineering and Measurement (ESEM2007), pp. 196-204 September 2007.
ID 488
分類 国際会議
タグ detection effects fault-prone module nder over sampling u
表題 (title) The Effects of Over and Under Sampling on Fault-Prone Module Detection
表題 (英文)
著者名 (author) Yasutaka Kamei,Akito Monden,Shinsuke Matsumoto,Takeshi Kakimoto,Ken-ichi Matsumoto
英文著者名 (author)
編者名 (editor)
編者名 (英文)
キー (key)
書籍・会議録表題 (booktitle) Proceedings of the 1st International Symposium on Empirical Software Engineering and Measurement (ESEM2007)
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 196-204
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) 9
出版年 (year) 2007
採択率 (acceptance)
URL
付加情報 (note) Madrid, Spain
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル 259.pdf (application/pdf) [一般閲覧可]
BiBTeXエントリ
@inproceedings{id488,
         title = {The Effects of Over and {U}nder Sampling on Fault-prone Module Detection},
        author = {Yasutaka Kamei and Akito Monden and Shinsuke Matsumoto and Takeshi Kakimoto and Ken-ichi Matsumoto},
     booktitle = {Proceedings of the 1st International Symposium on Empirical Software Engineering and Measurement (ESEM2007)},
         pages = {196-204},
         month = {9},
          year = {2007},
          note = {Madrid, Spain},
}