R. Vivanco, Y. Kamei, A. Monden, K. Matsumoto, and D. Jin, "Using Search-Based Metric Selection and Oversampling to Predict Fault Prone Modules," In Proc. IEEE Canadian Conference on Electrical and Computer Engineering 2010 (CCECE2010), pp. 1-6 May 2010.
ID 739
分類 国際会議
タグ fault metric modules oversampling predict prone search-based selection
表題 (title) Using Search-Based Metric Selection and Oversampling to Predict Fault Prone Modules
表題 (英文)
著者名 (author) Rodrigo Vivanco,Yasutaka Kamei,Akito Monden,Ken-ichi Matsumoto,Dean Jin
英文著者名 (author)
編者名 (editor)
編者名 (英文)
キー (key)
書籍・会議録表題 (booktitle) Proc. IEEE Canadian Conference on Electrical and Computer Engineering 2010 (CCECE2010)
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 1-6
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) 5
出版年 (year) 2010
採択率 (acceptance)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
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BiBTeXエントリ
@inproceedings{id739,
         title = {Using Search-Based Metric Selection and Oversampling to Predict Fault Prone Modules},
        author = {Rodrigo Vivanco and Yasutaka Kamei and Akito Monden and Ken-ichi Matsumoto and Dean Jin},
     booktitle = {Proc. IEEE Canadian Conference on Electrical and Computer Engineering 2010 (CCECE2010)},
         pages = {1-6},
         month = {5},
          year = {2010},
}