Y. Kamei, H. Sato, A. Monden, S. Kawaguchi, H. Uwano, M. Nagura, K. Matsumoto, and N. Ubayashi, "An Empirical Study of Fault Prediction with Code Clone Metrics," In Proc. Joint Conference of International Workshop on Software Measurement and International Conference on Software Process and Product Measurement (IWSM/Mensura2011), pp. 55-61 November 2011.
ID 810
分類 国際会議
タグ clone code empirical fault metrics prediction study
表題 (title) An Empirical Study of Fault Prediction with Code Clone Metrics
表題 (英文)
著者名 (author) Yasutaka Kamei,Hiroki Sato,Akito Monden,Shinji Kawaguchi,Hidetake Uwano,Masataka Nagura,Ken-ichi Matsumoto,Naoyasu Ubayashi
英文著者名 (author) Yasutaka Kamei,Hiroki Sato,Akito Monden,Shinji Kawaguchi,Hidetake Uwano,Masataka Nagura,Ken-ichi Matsumoto,Naoyasu Ubayashi
キー (key) Yasutaka Kamei,Hiroki Sato,Akito Monden,Shinji Kawaguchi,Hidetake Uwano,Masataka Nagura,Ken-ichi Matsumoto,Naoyasu Ubayashi
定期刊行物名 (journal) In Proc. Joint Conference of International Workshop on Software Measurement and International Conference on Software Process and Product Measurement (IWSM/Mensura2011)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 55-61
刊行月 (month) 11
出版年 (year) 2011
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル desc (application/pdf) [一般閲覧可]
BiBTeXエントリ
@article{id810,
         title = {An Empirical Study of Fault Prediction with Code Clone Metrics},
        author = {Yasutaka Kamei and Hiroki Sato and Akito Monden and Shinji Kawaguchi and Hidetake Uwano and Masataka Nagura and Ken-ichi Matsumoto and Naoyasu Ubayashi},
       journal = {In Proc. Joint Conference of International Workshop on Software Measurement and International Conference on Software Process and Product Measurement (IWSM/Mensura2011)},
         pages = {55-61},
         month = {11},
          year = {2011},
}