論文誌
[1] Osamu Mizuno and Hideaki Hata, "A Metric to Detect Fault-Prone Software Modules Using Text Classifier," International Journal of Reliability and Safety, volume 7, number 1, pages 17-31 August 2013.
国際会議
[1] Osamu Mizuno and Hideaki Hata, "An Integrated Approach to Detect Fault-Prone Modules Using Complexity and Text Feature Metrics," In Proc. of 2010 International Conference on Advanced Science and Technology (AST2010), pages 457-468 June 2010.
[2] Haruaki Tamada, Keiji Okamoto, Masahide Nakamura, Akito Monden, and Ken-ichi Matsumoto, "Dynamic Software Birthmarks to Detect the Theft of Windows Applications," In Proc. International Symposium on Future Software Technology 2004 (ISFST 2004), October 2004.