論文誌
[1] Akito Monden, Satoshi Okahara, Yuki Manabe, and Ken-ichi Matsumoto, "Guilty or Not Guilty: Using Clone Metrics to Determine Open Source Licensing Violations," IEEE Software, Special Issue on Software Protection (March/April 2011), volume 28, number 2, pages 42-47 March 2011.
国際会議
[1] Zhendong Shi, Jacky W. Keung, Kwabena Ebo Bennin, Nachai Limsettho, and Qinbao Song, "A Strategy to Determine When to Stop Using Automatic Bug Localization," In Proc. of 40th {IEEE} Annual Computer Software and Applications Conference (COMPSAC 2016), pages 185-190 June 2016.